GaSb Wafer

GaSb Wafer

Gallium antimonide (GaSb) material from PAM-XIAMEN a gallium antimonide wafer supplier is an important substrate material for manufacturing 2~4um lasers, infrared light-emitting tubes and high-speed low-noise avalanche photodiodes. Its three- and quaternary compound epitaxial growth has good lattice matching, and it is one of the ideal light source materials for manufacturing optical communication devices. Device manufacturing on single crystal GaSb substrate requires the preparation of a stable oxide layer with low interface density, high resistivity, high breakdown voltage and suitable for high-temperature processes. More about GaSb (Gallium Antimonide) crystal substrates please contact us.

Description

As one of important III–V compound semiconductor materials, gallium antimonide is applied in optoelectronic devices. Because of the gallium antimonide properties, such as high quantum efficiency, high hole mobility, and super lattices with customized optical and transport characteristics, devices fabricated on GaSb substrate is ideal for the mid-infrared (2-5um and 8-14um wavelength) applications, like imaging sensors for fire detection, surveillance system and environmental pollution monitors.

1. 4″ Epitaxy-ready GaSb Wafer Specification

Item Specifications
Dopant Undoped Zinc Tellurium
Conduction Type P-type P-type N-type
Wafer Diameter 4″
Wafer Orientation (100)±0.5°
Wafer Thickness 800±25um
Primary Flat Length 32.5±2.5mm
Secondary Flat Length 18±1mm
Carrier Concentration (1-2)x1017cm-3 (5-100)x1017cm-3 (1-20)x1017cm-3
Mobility 600-700cm2/V.s 200-500cm2/V.s 2000-3500cm2/V.s
EPD <2×103cm-2
TTV <15um
BOW <15um
WARP <20um
Laser marking upon request
Surface finish P/E, P/P
Epi ready yes
Package Single wafer container or cassette

 

2. 3″ Gallium Antimonide Wafer Specification

Item Specifications
Conduction Type P-type P-type N-type
Dopant Undoped Zinc Tellurium
Wafer Diameter 3″
Wafer Orientation (100)±0.5°
Wafer Thickness 600±25um
Primary Flat Length 22±2mm
Secondary Flat Length 11±1mm
Carrier Concentration (1-2)x1017cm-3 (5-100)x1017cm-3 (1-20)x1017cm-3
Mobility 600-700cm2/V.s 200-500cm2/V.s 2000-3500cm2/V.s
EPD <2×103cm-2
TTV <12um
BOW <12um
WARP <15um
Laser marking upon request
Surface finish P/E, P/P
Epi ready yes
Package Single wafer container or cassette

 

3. 2″ GaSb (Gallium Antimonide) Wafer Substrate Specification

Item Specifications
Dopant Undoped Zinc Tellurium
Conduction Type P-type P-type N-type
Wafer Diameter 2″
Wafer Orientation (100)±0.5°
Wafer Thickness 500±25um
Primary Flat Length 16±2mm
Secondary Flat Length 8±1mm
Carrier Concentration (1-2)x1017cm-3 (5-100)x1017cm-3 (1-20)x1017cm-3
Mobility 600-700cm2/V.s 200-500cm2/V.s 2000-3500cm2/V.s
EPD <2×103cm-2
TTV <10um
BOW <10um
WARP <12um
Laser Marking upon request
Surface Finish P/E, P/P
Epi Ready yes
Package Single wafer container or cassette

 

Many semiconductor device characteristics are closely related to characteristics of semiconductor surface. It is worth noting that single crystal GaSb wafer is easy to oxide by atmospheric oxygen formed natural surface oxides with a few nanometers thick since it has a very high chemically reactive surface.

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